An Approach of Dynamically Test COM Components Memory Abnormity

Abstract

With the rapid development in the field of components based software engineering, there is a need for security testing of third-party components. Components possess characteristics such as strict encapsulation and binary code reuse, making components testing more difficult than traditional testing. In this paper, we introduce a new testing system based on dot net for dynamic monitoring COM components’ memory abnormity by debugging technique, metadata extraction technology and windows message mechanisms. The system can perform metadata extracting algorithm from components which are described by XML documents. Meanwhile, the approach of obtaining components parameters is discussed. The empirical results demonstrate that the system can effectively monitor and capture memory abnormity during run-time.