Impact of leakage and short circuit current in rush current analysis of power gated domains

V. Sreekumar, S. Ravichandran
{"title":"Impact of leakage and short circuit current in rush current analysis of power gated domains","authors":"V. Sreekumar, S. Ravichandran","doi":"10.1109/SECON.2010.5453925","DOIUrl":null,"url":null,"abstract":"Power shut off being a key technique for power reduction in today's designs, it is critical to be able to verify circuit behavior when it is powered from an off state to an on state. The total rush current and turn-on time of the module can be impacted by the high short circuit current caused by slow signal slew rates and the leakage current of the module. In this paper, we present a study on how these effects impact the overall analysis and how they can be accounted for during a power-up analysis. The analysis has been done on ARM 968 processor based Wireless LAN IC.","PeriodicalId":286940,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.2010.5453925","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Power shut off being a key technique for power reduction in today's designs, it is critical to be able to verify circuit behavior when it is powered from an off state to an on state. The total rush current and turn-on time of the module can be impacted by the high short circuit current caused by slow signal slew rates and the leakage current of the module. In this paper, we present a study on how these effects impact the overall analysis and how they can be accounted for during a power-up analysis. The analysis has been done on ARM 968 processor based Wireless LAN IC.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
漏电流和短路电流对功率门控域涌流分析的影响
电源关闭是当今设计中降低功耗的关键技术,能够验证电路从关断状态到导通状态时的行为至关重要。由于信号转换速率慢导致的高短路电流和模块的漏电流会影响模块的总突流和导通时间。在本文中,我们提出了一项关于这些影响如何影响整体分析以及如何在通电分析期间解释它们的研究。对基于ARM 968处理器的无线局域网集成电路进行了分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Sensor information framework: Using workflow to integrate distributed sensor services PowerMon: Fine-grained and integrated power monitoring for commodity computer systems Acquisition and analysis of Terahertz Time Domain imaging and sensing Using aspects for testing nonfunctional requirements in object-oriented systems Wafer bonding technique based GaN/Quantum Dots/GaN system
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1