{"title":"2-26.5 GHZ On-Wafer Noise and S-Parameter Measurements Using a Solid State Tuner","authors":"V. Adamian","doi":"10.1109/ARFTG.1989.323954","DOIUrl":null,"url":null,"abstract":"A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.","PeriodicalId":153615,"journal":{"name":"34th ARFTG Conference Digest","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"34th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323954","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.
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