Namgyung Hwang, Yooseong Lim, Se-Hyeong Lee, Jeong Seok Lee, M. Yi
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引用次数: 1
Abstract
This paper introduces solution-processed Aluminum Oxide (AlOx) diffusion layer induced Indium Zinc Oxide (IZO) Thin Film Transistors(TFTs). We fixed IZO solution molar ratio, In : Zn = 3 : 2 and vary mole concentration of AlOx solution. We control the oxygen vacancies of IZO film using the tendency of Aluminum, capturing the oxygen vacancies and making the strong bond with oxygen atoms. Consequently, solution-processed IZO TFTs with Aluminum oxide diffusion layer showed improved device characteristics such stability and performance.