An Efficient Temperature-Dependent S-Parameter Calibration Routine

Abstract

To obtain accurate temperature-dependent S-parameters of on-wafer devices as well as packaged components, S-parameter calibrations should be established at each temperature. A BASIC program is described here that provides an efficient means of performing LRM and TRL calibrations at multiple temperatures. This program employs the "SIMs" calibration procedure available on the HP8510 ANA. An external computer is used to store raw calibration data, which is then fed back to the ANA to set up separate calibration sets for each desired temperature. To illustrate the procedure, temperature dependent S-parameter measurement data is presented for a 0.5um × 300um MESFET. Data will also be presented to show that proper calibration at each measurement temperature is needed to derive accurate temperature dependent device models.