{"title":"Market Forces Driving Acceptance Of ANSI/IEEE Std 1149.1-1990 Boundary-Scan","authors":"R. Tulloss","doi":"10.1109/ELECTR.1991.718269","DOIUrl":null,"url":null,"abstract":"ANSI/IEEE Std 1149.1-1990 [1,7] is advancing rapidly in acceptance. A recent survey of ATE manufacturers indicates they expect a significant impact. ASIC vendors show by their actions that it is not good business to be caught without Boundary-Scan-supporting cells in one's standard cell library. CAE/CAD tools are beginning to appear with specific features that support Boundary-Scan. Catalog parts are, beginning to appear with Boundary-Scan in them. A number of firms are publicly committed to using Boundary-Scan in their Systems. Department of Defense procurements are giving greater and greater emphasis to testability and diagnosability which will inevitably lead to implementation of test standards including ANSI/IEEE Std 1149.1-1990. In this paper we review the evidence for movement to acceptance of the Standard and some forces that appear to be driving this movement. Familiarity with the Standard is presupposed.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electro International, 1991","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELECTR.1991.718269","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
ANSI/IEEE Std 1149.1-1990 [1,7] is advancing rapidly in acceptance. A recent survey of ATE manufacturers indicates they expect a significant impact. ASIC vendors show by their actions that it is not good business to be caught without Boundary-Scan-supporting cells in one's standard cell library. CAE/CAD tools are beginning to appear with specific features that support Boundary-Scan. Catalog parts are, beginning to appear with Boundary-Scan in them. A number of firms are publicly committed to using Boundary-Scan in their Systems. Department of Defense procurements are giving greater and greater emphasis to testability and diagnosability which will inevitably lead to implementation of test standards including ANSI/IEEE Std 1149.1-1990. In this paper we review the evidence for movement to acceptance of the Standard and some forces that appear to be driving this movement. Familiarity with the Standard is presupposed.