Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718282
R. Hong, J.S. Liu
Two aspects of the design of space robots is covered implemented by neural networks and by hybrid approach with artificial intelligence. One is a neurocontroller for a real-time autonomous system. An optical control system developed saves the time for the image processing that analyzes an image sensor through the environment and induces a transformation over the sensor array. A prototype of the neurocontroller is able to learn and control by itself. The second aspect deals with the design of a Servo Control System for a Robot with the capability of "learning in Unanticipated Situations" incorporated in the system. The robot is assumed to be employed to perform useful tasks in an alien evironment. The model developed is shown to provide the robot with the capability to recover from unanticipated situations that can lead to the disruption of its normal operation, and to learn to avoid such situations in the future. These two aspects will be integrated for a design of a very intelligent autonomous space robot.
{"title":"Imaging And Controls For Mars Robots With Neural Networks","authors":"R. Hong, J.S. Liu","doi":"10.1109/ELECTR.1991.718282","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718282","url":null,"abstract":"Two aspects of the design of space robots is covered implemented by neural networks and by hybrid approach with artificial intelligence. One is a neurocontroller for a real-time autonomous system. An optical control system developed saves the time for the image processing that analyzes an image sensor through the environment and induces a transformation over the sensor array. A prototype of the neurocontroller is able to learn and control by itself. The second aspect deals with the design of a Servo Control System for a Robot with the capability of \"learning in Unanticipated Situations\" incorporated in the system. The robot is assumed to be employed to perform useful tasks in an alien evironment. The model developed is shown to provide the robot with the capability to recover from unanticipated situations that can lead to the disruption of its normal operation, and to learn to avoid such situations in the future. These two aspects will be integrated for a design of a very intelligent autonomous space robot.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"477 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124400950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718272
J. Ladd
{"title":"Critical Issues In The Synthesis And Processing Of High Temperature Superconductor Materials","authors":"J. Ladd","doi":"10.1109/ELECTR.1991.718272","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718272","url":null,"abstract":"","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122389027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718289
M. Catelani, G. Iuculano, A. Zanini
The large contribution of connectors to electronic systems unreliability is widely recognized. On the other hand there is even uncertainty about how best to define contact failure. However since connnector reliability test must ultimately match the needs of the electronics which will use these connectors. Testing methods can be meaningfully viewed from the electronics perspective, treating the connectors as 'black box". In this sense a research has been developed based on the contact resistance measurements and on the spectral analysis of the voltage drops while passing d.c. current when the contact is activated in its typical working conditions that is subjected to mechanical vibrations and to thermal fatiques.
{"title":"Connector Reliability Testing: Noise Spectral Analysis","authors":"M. Catelani, G. Iuculano, A. Zanini","doi":"10.1109/ELECTR.1991.718289","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718289","url":null,"abstract":"The large contribution of connectors to electronic systems unreliability is widely recognized. On the other hand there is even uncertainty about how best to define contact failure. However since connnector reliability test must ultimately match the needs of the electronics which will use these connectors. Testing methods can be meaningfully viewed from the electronics perspective, treating the connectors as 'black box\". In this sense a research has been developed based on the contact resistance measurements and on the spectral analysis of the voltage drops while passing d.c. current when the contact is activated in its typical working conditions that is subjected to mechanical vibrations and to thermal fatiques.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114145853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718211
K. Wolf
{"title":"Flash Memory Technology - To Design Where No Non Volatile Memory Has Gone Before","authors":"K. Wolf","doi":"10.1109/ELECTR.1991.718211","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718211","url":null,"abstract":"","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130660641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718285
W. W. Dickhart
{"title":"Status Of Transrapid Maglev","authors":"W. W. Dickhart","doi":"10.1109/ELECTR.1991.718285","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718285","url":null,"abstract":"","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121660095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718226
T. A. Pearson
Advanced Manufacturing Execution Systems are being developed to monitor, control, and improve manufacturing processes. Combining statistical methods with modern computing and information technologies, this new class of modern plant management system provides operators and managers with real-time views of all of their manufacturing resources. This paper addresses key issues for integrating on-line statistical methods with operational information. Real competitive advantage is the result.
{"title":"On-Line Statistics In Manufacturing","authors":"T. A. Pearson","doi":"10.1109/ELECTR.1991.718226","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718226","url":null,"abstract":"Advanced Manufacturing Execution Systems are being developed to monitor, control, and improve manufacturing processes. Combining statistical methods with modern computing and information technologies, this new class of modern plant management system provides operators and managers with real-time views of all of their manufacturing resources. This paper addresses key issues for integrating on-line statistical methods with operational information. Real competitive advantage is the result.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121667636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718224
B. Marshall
There are many excellent "How To & Why To" books on Global marketing procedures and techniques. Little has been written to help a troubled company figure out what went wrong in a Global Marketing crusade and how to fix it without high risk surgery. It is reasonable to assume that if a company is not doing well in its local market, it will do much worse in a foreign market, since the principals are the same. In cases where this is not true, foreign autonomy is the reason. Most failures in Global marketing are a result of violating the most important principle "Market Focus", which will be explored here, along with some diagnostics and solutions. Local Think, a subset of the Market Focus principle is critical to success in Global Marketing. Principles rather than techniques will be stressed. Principles are general and timeless, while techniques are situation and time specific.
{"title":"Global Marketing - \"What Went Wrong?\" Local Think and Market Focus","authors":"B. Marshall","doi":"10.1109/ELECTR.1991.718224","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718224","url":null,"abstract":"There are many excellent \"How To & Why To\" books on Global marketing procedures and techniques. Little has been written to help a troubled company figure out what went wrong in a Global Marketing crusade and how to fix it without high risk surgery. It is reasonable to assume that if a company is not doing well in its local market, it will do much worse in a foreign market, since the principals are the same. In cases where this is not true, foreign autonomy is the reason. Most failures in Global marketing are a result of violating the most important principle \"Market Focus\", which will be explored here, along with some diagnostics and solutions. Local Think, a subset of the Market Focus principle is critical to success in Global Marketing. Principles rather than techniques will be stressed. Principles are general and timeless, while techniques are situation and time specific.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126307237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718243
D. Telfer, L.A. Derrick
The Computer Integrated Manufacturing (CIM) architecture consists of three Ievels of integration: physical, application and business. This paper focuses on the CIM application integration. After the physical connections are established between stand alone systems, the next level in developing a CIM based enterprise is to architect an application integration strategy. There are three key areas to support this level of CIM integration: the manufacturing process, a central data repository and the applications to manage the distributed processes. Understanding the actual process includes an analysis of the current state of the facilities and operations. The central data repository is the focal point for shared data that can be accessed by both users and applications. The CIM applications are based on new technologies which include Application and System Enablers.
{"title":"Application Integration For CIM","authors":"D. Telfer, L.A. Derrick","doi":"10.1109/ELECTR.1991.718243","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718243","url":null,"abstract":"The Computer Integrated Manufacturing (CIM) architecture consists of three Ievels of integration: physical, application and business. This paper focuses on the CIM application integration. After the physical connections are established between stand alone systems, the next level in developing a CIM based enterprise is to architect an application integration strategy. There are three key areas to support this level of CIM integration: the manufacturing process, a central data repository and the applications to manage the distributed processes. Understanding the actual process includes an analysis of the current state of the facilities and operations. The central data repository is the focal point for shared data that can be accessed by both users and applications. The CIM applications are based on new technologies which include Application and System Enablers.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122267763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-04-16DOI: 10.1109/ELECTR.1991.718199
I. Nair
Health effects from 60 Hz electric and magnetic fields have become a matter of public and industry concern in recent years. This article examines the scientific evidence briefly with a focus on the uncertainty, and discusses the public policy implications.
{"title":"Survey Of EM Effects And Public Policy Implications","authors":"I. Nair","doi":"10.1109/ELECTR.1991.718199","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718199","url":null,"abstract":"Health effects from 60 Hz electric and magnetic fields have become a matter of public and industry concern in recent years. This article examines the scientific evidence briefly with a focus on the uncertainty, and discusses the public policy implications.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"446 1-3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132412695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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