Lei Li, S. Lei, Ruoyu Wang, Hong Yu, Qing‐An Huang
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引用次数: 0
Abstract
We have simulated the piezoresistance coefficients (Pie coefficients) in Si/Ge core-shell nanowires with a certain diameter and different thickness Ge-shell in the longitudinal direction on the basis of First-Principles calculations of models. Through calculations, it was found that the Pie coefficients of the nanowire constructed with an axis of Si atoms and three layers of Ge atoms outside (Si1Ge3 in Figure1) almost kept consistent with the GeNW as negative values. Under the compressive condition, the Pie coefficient of the Si2Ge2 can reach up to-21.20 × 10-11Pα-1. However, when the Ge-shell was decreased to only one Ge-atom layer, the Pie coefficients varied from negative values to positive ones. We also obtained the pie coefficients of the SiNW: 9.46 x 10-11Pa-1 and 35.77 x 10-11Pa-1 respectively under compression and tension.
在模型第一性原理计算的基础上,模拟了具有一定直径和不同Ge壳厚度的Si/Ge核壳纳米线纵向上的压阻系数(Pie系数)。通过计算发现,以Si原子为轴,外面有三层Ge原子(图1中的Si1Ge3)构成的纳米线的Pie系数几乎与GeNW保持一致,为负值。在压缩条件下,Si2Ge2的饼系数可达21.20 × 10-11Pα-1。然而,当ge壳层减少到只有一个ge原子层时,Pie系数由负值变为正值。得到了压缩和拉伸作用下SiNW的饼系数分别为9.46 x 10-11Pa-1和35.77 x 10-11Pa-1。