{"title":"Fault coverage of protocol test methods","authors":"D. Sidhu, Ting-Kau Leung","doi":"10.1109/INFCOM.1988.12901","DOIUrl":null,"url":null,"abstract":"The authors present an estimation of fault coverage of four protocol test sequences generation techniques (T-, U-, D-, and W-methods) using Monte Carlo simulation on a simple protocol machine. The ability of a test sequence to decide whether a protocol implementation conforms to its specification heavily relies upon the range of faults that it can capture. This study shows that a test sequence produced by T-method has a poor fault detection capability whereas test sequences produced by U-, D- and W-methods have fault coverage comparable to each other and superior to that for T-method on several classes of randomly generated machines used.<<ETX>>","PeriodicalId":436217,"journal":{"name":"IEEE INFOCOM '88,Seventh Annual Joint Conference of the IEEE Computer and Communcations Societies. Networks: Evolution or Revolution?","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"38","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE INFOCOM '88,Seventh Annual Joint Conference of the IEEE Computer and Communcations Societies. Networks: Evolution or Revolution?","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INFCOM.1988.12901","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 38
Abstract
The authors present an estimation of fault coverage of four protocol test sequences generation techniques (T-, U-, D-, and W-methods) using Monte Carlo simulation on a simple protocol machine. The ability of a test sequence to decide whether a protocol implementation conforms to its specification heavily relies upon the range of faults that it can capture. This study shows that a test sequence produced by T-method has a poor fault detection capability whereas test sequences produced by U-, D- and W-methods have fault coverage comparable to each other and superior to that for T-method on several classes of randomly generated machines used.<>