{"title":"Fault coverage of protocol test methods","authors":"D. Sidhu, Ting-Kau Leung","doi":"10.1109/INFCOM.1988.12901","DOIUrl":null,"url":null,"abstract":"The authors present an estimation of fault coverage of four protocol test sequences generation techniques (T-, U-, D-, and W-methods) using Monte Carlo simulation on a simple protocol machine. The ability of a test sequence to decide whether a protocol implementation conforms to its specification heavily relies upon the range of faults that it can capture. This study shows that a test sequence produced by T-method has a poor fault detection capability whereas test sequences produced by U-, D- and W-methods have fault coverage comparable to each other and superior to that for T-method on several classes of randomly generated machines used.<<ETX>>","PeriodicalId":436217,"journal":{"name":"IEEE INFOCOM '88,Seventh Annual Joint Conference of the IEEE Computer and Communcations Societies. Networks: Evolution or Revolution?","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"38","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE INFOCOM '88,Seventh Annual Joint Conference of the IEEE Computer and Communcations Societies. Networks: Evolution or Revolution?","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INFCOM.1988.12901","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 38

Abstract

The authors present an estimation of fault coverage of four protocol test sequences generation techniques (T-, U-, D-, and W-methods) using Monte Carlo simulation on a simple protocol machine. The ability of a test sequence to decide whether a protocol implementation conforms to its specification heavily relies upon the range of faults that it can capture. This study shows that a test sequence produced by T-method has a poor fault detection capability whereas test sequences produced by U-, D- and W-methods have fault coverage comparable to each other and superior to that for T-method on several classes of randomly generated machines used.<>
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协议测试方法的故障覆盖率
作者提出了四种协议测试序列生成技术(T-, U-, D-和w -方法)的故障覆盖率估计,使用蒙特卡罗模拟在一个简单的协议机上。测试序列决定协议实现是否符合其规范的能力在很大程度上依赖于它可以捕获的故障范围。本研究表明,t方法产生的测试序列的故障检测能力较差,而U-、D-和w -方法产生的测试序列在使用的几种随机生成机器上的故障覆盖率相当且优于t方法。
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