A Pseudo-Deterministic Functional ATPG based on EFSM Traversing

Abstract

This paper presents a functional ATPG framework which exploits the extended finite state machine (EFSM) model to pseudo-deterministically generate test sequences. A constraint solver or a SAT-solver is used to generate test vectors that allow us to uniformly traverse the state space of the design under test (DUT). This definitely increases the ability of the ATPG to observe and control hard-to-detect faults