{"title":"A low-leakage current power 180-nm CMOS SRAM","authors":"T. Enomoto, Yuki Higuchi","doi":"10.1109/ASPDAC.2008.4483914","DOIUrl":null,"url":null,"abstract":"A low leakage power, 180-nm 1K-b SRAM was fabricated. The stand-by leakage power of a 1K-bit memory cell array incorporating a newly-developed leakage current reduction circuit called a \"self-controllable voltage level (SVL)\" circuit was only 3.7 nW, which is 5.4% that of an equivalent conventional memory-cell array at a VDD of 1.8 V. On the other hand, the speed remained almost constant with a minimal overhead in terms of the memory cell array area.","PeriodicalId":277556,"journal":{"name":"2008 Asia and South Pacific Design Automation Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Asia and South Pacific Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2008.4483914","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
A low leakage power, 180-nm 1K-b SRAM was fabricated. The stand-by leakage power of a 1K-bit memory cell array incorporating a newly-developed leakage current reduction circuit called a "self-controllable voltage level (SVL)" circuit was only 3.7 nW, which is 5.4% that of an equivalent conventional memory-cell array at a VDD of 1.8 V. On the other hand, the speed remained almost constant with a minimal overhead in terms of the memory cell array area.