{"title":"TEMPLATES: a test generation procedure for synchronous sequential circuits","authors":"I. Pomeranz, S. Reddy","doi":"10.1109/ATS.1997.643923","DOIUrl":null,"url":null,"abstract":"We develop the basic definitions and procedures for a test generation concept referred to as templates that magnifies the effectiveness of test generation by taking advantage of the fact that many faults have \"similar\" test sequences. Once a template is generated, several test sequences to detect different faults are derived from it at a reduced complexity compared to the complexity of test generation.","PeriodicalId":330767,"journal":{"name":"Proceedings Sixth Asian Test Symposium (ATS'97)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Sixth Asian Test Symposium (ATS'97)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1997.643923","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We develop the basic definitions and procedures for a test generation concept referred to as templates that magnifies the effectiveness of test generation by taking advantage of the fact that many faults have "similar" test sequences. Once a template is generated, several test sequences to detect different faults are derived from it at a reduced complexity compared to the complexity of test generation.
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