Test point selection based on functional simulation and FMMEA for an electronic system on PHM

Abstract

Test points are observation points extracting system information, so the selection of test points is a key step for electronic systems on PHM. Test points should be able to characterize the fault precursors of the system for diagnosis and prognosis with accuracy. Current methods of selection of test points generally rely on functional simulation analysis or testability modeling analysis. This paper makes an attempt to combine the method of circuit functional simulation analysis with FMMEA method to select test points for an electronic system, and presents a case study of a board level system to illustrate it.