Interferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1…J5 method

L. Marcal, J. H. Galeti, R. Higuti, C. Kitano, E. C. Silva
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引用次数: 4

Abstract

In this work, nanometric displacement amplitudes of a Piezoelectric Flextensional Actuator (PFA) designed using the topology optimization technique and operating in its linear range are measured by using a homodyne Michelson interferometer. A new improved version of the J1...J4 method for optical phase measurements, named J1...J5 method, is presented, which is of easier implementation than the original one. This is a passive phase detection scheme, unaffected by signal fading, source instabilities and changes in visibility. Experimental results using this improvement were compared with those obtained by using the J1...J4, J1...J6(pos) and J1...J6(neg) methods, concluding that the dynamic range is increased while maintaining the sensitivity. Analysis based on the 1/f voltage noise and random fading show the new method is more stable to phase drift than all those methods.
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用J1…J5方法干涉测量压电挠张作动器的纳米位移
本文采用拓扑优化技术设计了压电挠张致动器(PFA),并利用纯差式迈克尔逊干涉仪测量了其线性范围内的纳米位移幅值。J1的新改进版本…J4光学相位测量方法,命名为J1…提出了一种比原方法更容易实现的J5方法。这是一种被动相位检测方案,不受信号衰落、源不稳定和可见性变化的影响。将改进后的实验结果与J1…J4, J1…J6(pos)和J1…J6(neg)方法,得出在保持灵敏度的同时增加了动态范围的结论。基于1/f电压噪声和随机衰落的分析表明,新方法对相漂的稳定性优于现有方法。
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