A soft error vulnerability analysis framework for Xilinx FPGAs

Abstract

Today's SRAM-based FPGAs provide a reach set of computing resources which makes them attractive in demanding and critical application domains, such as avionics and space. Unfortunately, their high reliance on SRAM configuration memory arise reliability issues due to the single-event upsets (SEUs). Considering the criticality of these applications, the vulnerability analysis of FPGA designs to SEUs becomes essential part of the design flow. In this context, we present an open-source framework for the soft error vulnerability analysis of Xilinx FPGA devices. The proposed framework will allow researchers to evaluate their reliability-aware CAD algorithms and estimate the soft error susceptibility of the designs at early stages of the implementation flow for the latest Xilinx architectures.