{"title":"Characterisation of micro-controller electromagnetic emission: models for an international standard","authors":"S. Ben Dhia, S. Baffreau, S. Calvet, E. Sicard","doi":"10.1109/ICCDCS.2002.1004087","DOIUrl":null,"url":null,"abstract":"Following the scale down of integrated circuit technology and the continuous shift toward very high frequencies, the electromagnetic compatibility problems at IC level have recently risen in importance. To predict the electromagnetic behaviour of equipment it is necessary to model IC interface switching and its internal activities. Accurate IC modeling is necessary to realise electromagnetic behaviour simulation. This document describes a conducted mode parasitic emission model for complex IC internal activities. The authors compare conducted emission measurements on a micro-controller with simulations using the proposed model. This model describes more accurately the electromagnetic emissions of electronic equipment by taking into account the influence of internal activities. In order to validate the predicted core activity methodologies, the authors plan to conduct some internal measurements thanks to an on chip sampling technique.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2002.1004087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Following the scale down of integrated circuit technology and the continuous shift toward very high frequencies, the electromagnetic compatibility problems at IC level have recently risen in importance. To predict the electromagnetic behaviour of equipment it is necessary to model IC interface switching and its internal activities. Accurate IC modeling is necessary to realise electromagnetic behaviour simulation. This document describes a conducted mode parasitic emission model for complex IC internal activities. The authors compare conducted emission measurements on a micro-controller with simulations using the proposed model. This model describes more accurately the electromagnetic emissions of electronic equipment by taking into account the influence of internal activities. In order to validate the predicted core activity methodologies, the authors plan to conduct some internal measurements thanks to an on chip sampling technique.