Darrell E. Leber, Richard L. Chaney, D. Hackler, Brian N. Meek, Seth D. Leija, K. DeGregorio, S. Wald, Dale G. Wilson
{"title":"Advances in Flexible Hybrid Electronics Reliability","authors":"Darrell E. Leber, Richard L. Chaney, D. Hackler, Brian N. Meek, Seth D. Leija, K. DeGregorio, S. Wald, Dale G. Wilson","doi":"10.1109/WMED.2017.7916924","DOIUrl":null,"url":null,"abstract":"Flexible Hybrid Electronics combine the best characteristics of printed electronics and silicon ICs to create high performance, ultra-thin, physically flexible systems. Tests and methods are being developed to evaluate the reliability of these systems. Initial results are presented for flexible hybrid electronics systems.","PeriodicalId":287760,"journal":{"name":"2017 IEEE Workshop on Microelectronics and Electron Devices (WMED)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Workshop on Microelectronics and Electron Devices (WMED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WMED.2017.7916924","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Flexible Hybrid Electronics combine the best characteristics of printed electronics and silicon ICs to create high performance, ultra-thin, physically flexible systems. Tests and methods are being developed to evaluate the reliability of these systems. Initial results are presented for flexible hybrid electronics systems.
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