{"title":"Diffusion Distance for Histogram Comparison","authors":"Haibin Ling, K. Okada","doi":"10.1109/CVPR.2006.99","DOIUrl":null,"url":null,"abstract":"In this paper we propose diffusion distance, a new dissimilarity measure between histogram-based descriptors. We define the difference between two histograms to be a temperature field. We then study the relationship between histogram similarity and a diffusion process, showing how diffusion handles deformation as well as quantization effects. As a result, the diffusion distance is derived as the sum of dissimilarities over scales. Being a cross-bin histogram distance, the diffusion distance is robust to deformation, lighting change and noise in histogram-based local descriptors. In addition, it enjoys linear computational complexity which significantly improves previously proposed cross-bin distances with quadratic complexity or higher. We tested the proposed approach on both shape recognition and interest point matching tasks using several multi-dimensional histogram-based descriptors including shape context, SIFT, and spin images. In all experiments, the diffusion distance performs excellently in both accuracy and efficiency in comparison with other state-of-the-art distance measures. In particular, it performs as accurately as the Earth Mover’s Distance with much greater efficiency.","PeriodicalId":421737,"journal":{"name":"2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'06)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"270","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CVPR.2006.99","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 270
Abstract
In this paper we propose diffusion distance, a new dissimilarity measure between histogram-based descriptors. We define the difference between two histograms to be a temperature field. We then study the relationship between histogram similarity and a diffusion process, showing how diffusion handles deformation as well as quantization effects. As a result, the diffusion distance is derived as the sum of dissimilarities over scales. Being a cross-bin histogram distance, the diffusion distance is robust to deformation, lighting change and noise in histogram-based local descriptors. In addition, it enjoys linear computational complexity which significantly improves previously proposed cross-bin distances with quadratic complexity or higher. We tested the proposed approach on both shape recognition and interest point matching tasks using several multi-dimensional histogram-based descriptors including shape context, SIFT, and spin images. In all experiments, the diffusion distance performs excellently in both accuracy and efficiency in comparison with other state-of-the-art distance measures. In particular, it performs as accurately as the Earth Mover’s Distance with much greater efficiency.