A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis

Abstract

This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.