{"title":"A 1Gbit SDRAM With An Independent Sub-array Controlled Scheme And A Hierarchical Decoding Scheme","authors":"Yoon, Lee, Moon, Kim, Cho","doi":"10.1109/VLSIC.1997.623828","DOIUrl":null,"url":null,"abstract":"A s the realm of high performance DRAM has been extended up to the Gigabit scale [1 ,2 ] , the large device size has been the major concern, presenting challenges in attaining acceptable yield and power consumption. A s the ratio of the total chip s ize and the minimum feature s ize is rapidly increased, even the smallest defects will cause failures, often very difficult t o analyze. Moreover, with high speed synchronous bank interleaving operation, the power consumption is large, requring a tight control of the power budget in the peripheral regions. Th i s paper presents design techniques utilizing the i n d e p e n d e n t sub-array controlled scheme and the hierarchical decoding scheme t o achieve enhanced failure analysis, lower power consumption, and smaller chip size in a prototype lGbit synchronous DRAM (SDRAM).","PeriodicalId":175678,"journal":{"name":"Symposium 1997 on VLSI Circuits","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Symposium 1997 on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.1997.623828","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
A s the realm of high performance DRAM has been extended up to the Gigabit scale [1 ,2 ] , the large device size has been the major concern, presenting challenges in attaining acceptable yield and power consumption. A s the ratio of the total chip s ize and the minimum feature s ize is rapidly increased, even the smallest defects will cause failures, often very difficult t o analyze. Moreover, with high speed synchronous bank interleaving operation, the power consumption is large, requring a tight control of the power budget in the peripheral regions. Th i s paper presents design techniques utilizing the i n d e p e n d e n t sub-array controlled scheme and the hierarchical decoding scheme t o achieve enhanced failure analysis, lower power consumption, and smaller chip size in a prototype lGbit synchronous DRAM (SDRAM).
随着高性能DRAM领域已经扩展到千兆级[1,2],大设备尺寸一直是主要问题,在获得可接受的产量和功耗方面提出了挑战。由于芯片总尺寸与最小特征尺寸的比例迅速增加,即使是最小的缺陷也会导致故障,往往很难分析。此外,由于高速同步银行交错操作,功耗大,需要严格控制外围区域的功率预算。Th我年代提出设计技术利用n d e p e n d e n t赋控制方案和分层译码方案t o达到增强的失效分析,更低的能耗,更小的芯片尺寸原型lGbit同步DRAM (SDRAM)。