Huaping Jiang, Jin Wei, X. Dai, C. Zheng, Maolong Ke, Xiaochuan Deng, Y. Sharma, I. Deviny, P. Mawby
{"title":"SiC MOSFET with built-in SBD for reduction of reverse recovery charge and switching loss in 10-kV applications","authors":"Huaping Jiang, Jin Wei, X. Dai, C. Zheng, Maolong Ke, Xiaochuan Deng, Y. Sharma, I. Deviny, P. Mawby","doi":"10.23919/ISPSD.2017.7988890","DOIUrl":null,"url":null,"abstract":"A silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) for 10-kV application is proposed in this paper, which features a built-in Schottky barrier diode (SBD). Therefore, the body diode is free from activation during the third quadrant conduction state, which is beneficial for reducing the switching loss and suppressing bipolar degradation. Numerical simulations with Sentaurus TCAD are carried out to investigate the characteristics of the proposed structure in comparison to the conventional MOSFET and SBD pair. It is found that the proposed structure achieves lower reverse recovery charge and switching loss owing to three factors, i.e., faster switching speed, smaller capacitive charge, and body diode deactivation, and therefore is a superior choice for 10-kV applications.","PeriodicalId":202561,"journal":{"name":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"38","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISPSD.2017.7988890","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 38
Abstract
A silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) for 10-kV application is proposed in this paper, which features a built-in Schottky barrier diode (SBD). Therefore, the body diode is free from activation during the third quadrant conduction state, which is beneficial for reducing the switching loss and suppressing bipolar degradation. Numerical simulations with Sentaurus TCAD are carried out to investigate the characteristics of the proposed structure in comparison to the conventional MOSFET and SBD pair. It is found that the proposed structure achieves lower reverse recovery charge and switching loss owing to three factors, i.e., faster switching speed, smaller capacitive charge, and body diode deactivation, and therefore is a superior choice for 10-kV applications.