J. Rodgers, L. Rockett, J. Maimon, T. Storey, P. Nixon
{"title":"Characterization and qualification of radiation hardened nonvolatile phase change memory technology","authors":"J. Rodgers, L. Rockett, J. Maimon, T. Storey, P. Nixon","doi":"10.1109/AERO.2010.5446662","DOIUrl":null,"url":null,"abstract":"BAE Systems has developed a 4Mb Non-Volatile Chalcogenide Random Access Memory (C-RAM) optimized for the radiation environments encountered in spacecraft applications. C-RAM is a phase change memory with a unique combination of features that collectively provide a high-density, low-power, non-volatile memory solution that is radiation hardened and meets rigorous reliability requirements. The device has completed QML-Q qualification testing and is now in full production. Flight qualified C-RAM will serve the critical need for rad hard nonvolatile RAM in strategic space and military applications. This paper describes the 4Mb C-RAM product and presents the results of C-RAM QML-Q qualification testing including detailed analyses of the test results in all the radiation environments. 1 2","PeriodicalId":378029,"journal":{"name":"2010 IEEE Aerospace Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Aerospace Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO.2010.5446662","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
BAE Systems has developed a 4Mb Non-Volatile Chalcogenide Random Access Memory (C-RAM) optimized for the radiation environments encountered in spacecraft applications. C-RAM is a phase change memory with a unique combination of features that collectively provide a high-density, low-power, non-volatile memory solution that is radiation hardened and meets rigorous reliability requirements. The device has completed QML-Q qualification testing and is now in full production. Flight qualified C-RAM will serve the critical need for rad hard nonvolatile RAM in strategic space and military applications. This paper describes the 4Mb C-RAM product and presents the results of C-RAM QML-Q qualification testing including detailed analyses of the test results in all the radiation environments. 1 2
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
