H. Hayashi, T. Kuroda, K. Kato, K. Fukuda, S. Baba, Y. Fukuda
{"title":"ESD protection design using a mixed-mode simulation for advanced devices","authors":"H. Hayashi, T. Kuroda, K. Kato, K. Fukuda, S. Baba, Y. Fukuda","doi":"10.1109/EOSESD.2004.5272620","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a new ESD protection design methodology using a mixed-mode ESD simulation that takes account of a coupling effect for both device and circuit. As a result, we can analysis the each protection unit operation and select the optimized protection circuits in prevention of ESD failure on separated power supply units by prediction of the simulation.","PeriodicalId":302866,"journal":{"name":"2004 Electrical Overstress/Electrostatic Discharge Symposium","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Electrical Overstress/Electrostatic Discharge Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2004.5272620","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In this paper, we propose a new ESD protection design methodology using a mixed-mode ESD simulation that takes account of a coupling effect for both device and circuit. As a result, we can analysis the each protection unit operation and select the optimized protection circuits in prevention of ESD failure on separated power supply units by prediction of the simulation.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
