Form measurement of thin cylinders using three-wavelength interferometry

Alexander Hoink, K. Meiners-Hagen, O. Jusko, A. Abou-Zeid
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引用次数: 1

Abstract

A new interferometric measurement technique for form measurements of cylindrical objects with diameters up to 2.5 mm is presented. This technique provides a contactless and non-scanning form measurement of reflective cylinders with a resolution in the nanometre range. The specimen is placed in the centre of an inverse conic mirror and is illuminated by a diode laser. The reflected light is superposed under a slight angle with a reference beam and imaged on a CCD camera. From the recorded interferogram the surface topography of the specimen can be derived by a spatial phase shifting algorithm. The measurement range can be varied from the nanometre to the micrometre range by using three lasers with different wavelengths. Results of form measurements of different samples are presented and discussed.
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用三波长干涉测量法测量薄圆柱体
提出了一种新的干涉测量技术,用于直径达2.5 mm的圆柱形物体的形状测量。该技术提供了一种非接触式和非扫描形式的反射圆柱体测量,分辨率在纳米范围内。样品被放置在一个反圆锥镜的中心,并由一个二极管激光照射。反射光与参考光束以微小角度叠加,并在CCD相机上成像。从记录的干涉图中,可以通过空间相移算法推导出试样的表面形貌。通过使用三种不同波长的激光器,测量范围可以从纳米到微米不等。对不同样品的形态测量结果进行了介绍和讨论。
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