Slew rate and delay optimization of sense amplifier using tradeoff between supply voltage and threshold

G. Jain, Keerti Vyas, V. Maurya, Anu Mehra
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引用次数: 3

Abstract

Output of SRAM memory circuit is very small i.e. in few milli volts. While reading logic 1 sometimes it is read as logic 0. Due to this malfunctioning of circuit, problem of hazards occur. To overcome this problem we use sense amplifiers. The work of sense amplifier is to sense low power signal from bit line of SRAM memory circuit and amplify the small voltage swing to recognizable logic levels so that data can be interpreted clearly by logic outside the memory. Here we have reduced the delay of the sense amplifier by optimizing the supply voltage i.e. VDD. For this purpose tradeoff between delays, VDD and offset voltage has been done. We have examined the results using IC flow tool.
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利用电源电压和阈值的权衡优化感测放大器的摆率和延迟
SRAM存储电路的输出非常小,即在几毫伏。当读取逻辑1时,有时它被读取为逻辑0。由于电路的这种故障,发生了危险问题。为了克服这个问题,我们使用感测放大器。感测放大器的工作是感测来自SRAM存储电路位线的低功率信号,并将小的电压摆幅放大到可识别的逻辑电平,以便存储器外的逻辑能够清楚地解释数据。在这里,我们通过优化电源电压(即VDD)来减少感测放大器的延迟。为此,在延迟、VDD和失调电压之间进行了权衡。我们使用IC流工具检查了结果。
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