{"title":"Characterization methods for the sensitivity of quartz oscillators to the environment","authors":"J. Gagnepain","doi":"10.1109/FREQ.1989.68872","DOIUrl":null,"url":null,"abstract":"The distinction is shown between characterizing a complete oscillator, and characterizing only the quartz resonator by using a passive phase bridge. Advantages and disadvantages of the two approaches are discussed. Then measurements of temperature sensitivities, including quasistatic or dynamic thermal conditions are presented. One important points how to measure the real temperature of the device under test (quartz crystal for instance) rather than the temperature of the probe. Methods for measuring acceleration and pressure sensitivities are presented taking spurious effects of temperature changes into consideration. Various problems are discussed in connection with the measurement of the sensitivity to magnetic fields and electric fields.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 43rd Annual Symposium on Frequency Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1989.68872","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
The distinction is shown between characterizing a complete oscillator, and characterizing only the quartz resonator by using a passive phase bridge. Advantages and disadvantages of the two approaches are discussed. Then measurements of temperature sensitivities, including quasistatic or dynamic thermal conditions are presented. One important points how to measure the real temperature of the device under test (quartz crystal for instance) rather than the temperature of the probe. Methods for measuring acceleration and pressure sensitivities are presented taking spurious effects of temperature changes into consideration. Various problems are discussed in connection with the measurement of the sensitivity to magnetic fields and electric fields.<>
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
