The development of computerized measurement system for electronic device characterization

Abstract

Rapid changes in the development of electronic fabrication have lead us to have chalenges in supporting the researches. When a prototype of devices has to be examined and analyze, it needs to take some measurements that sometimes take time, not recorded, uncontinous measurement, and need a lot of devices to do it. In this paper, a tool to solve the problem in development of electronic fabrication will be discussed. The designed system offers many possiblity such as able to measure both organic and inorganis devices, able to measure various device characteristics such as current-voltage, light intensity-voltage, and life time. The resolution of measurement can be adjusted depending on the the capability of programmable power supply. The measurement is user friendly by the human machine interface which supporting by the developed software.