{"title":"Database Protection Techniques for Electromagnetic Radiation Based on Machine Learning","authors":"Xuan-Chuan Cao, Bingchen Ge, Mengxue Li, Hai‐Ping Wang, Jiuchun Ren","doi":"10.1109/APCAP56600.2022.10068965","DOIUrl":null,"url":null,"abstract":"Ships and aircraft sometimes suffered strong electromagnetic radiation during navigation, which always causes certain damage to their electronic equipment through coupling, so the protection of devices has become extremely important. However, there are thorny problems in the test of strong electromagnetic radiation effect, such as elaborate data management, non-standard data and so on. Therefore, the strong electromagnetic radiation effect and database technology is combined to analyze the data through machine learning, to provide a feasible solution for the protection process of them.","PeriodicalId":197691,"journal":{"name":"2022 IEEE 10th Asia-Pacific Conference on Antennas and Propagation (APCAP)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 10th Asia-Pacific Conference on Antennas and Propagation (APCAP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APCAP56600.2022.10068965","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Ships and aircraft sometimes suffered strong electromagnetic radiation during navigation, which always causes certain damage to their electronic equipment through coupling, so the protection of devices has become extremely important. However, there are thorny problems in the test of strong electromagnetic radiation effect, such as elaborate data management, non-standard data and so on. Therefore, the strong electromagnetic radiation effect and database technology is combined to analyze the data through machine learning, to provide a feasible solution for the protection process of them.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
