{"title":"Characterisation of microcontroller susceptibility to radio frequency interference","authors":"S. Baffreau, S. Bendhia, M. Ramdani, E. Sicard","doi":"10.1109/ICCDCS.2002.1004088","DOIUrl":null,"url":null,"abstract":"Work in the field of electromagnetic compatibility (EMC), generally concentrating on noise and interference at electronic systems, has recently focused more attention on integrated circuits (ICs). In this work, we mainly focus on immunity of programmable devices to radio frequency interference (RFI). This paper presents various kinds of RFI and how it can be coupled to a digital signal processor (DSP) or micro-controller. A new approach for immunity measurement is introduced and some ways to improve embedded software are proposed.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2002.1004088","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23
Abstract
Work in the field of electromagnetic compatibility (EMC), generally concentrating on noise and interference at electronic systems, has recently focused more attention on integrated circuits (ICs). In this work, we mainly focus on immunity of programmable devices to radio frequency interference (RFI). This paper presents various kinds of RFI and how it can be coupled to a digital signal processor (DSP) or micro-controller. A new approach for immunity measurement is introduced and some ways to improve embedded software are proposed.
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