{"title":"Adaptive settings of distance protection to prevent mal-operation under severe voltage fluctuation","authors":"Ahmad Farid Bin Abidin, A. Mohamed","doi":"10.1109/ICSENGT.2011.5993442","DOIUrl":null,"url":null,"abstract":"A new algorithm for adaptive setting of Zone 3 of distance relays during severe voltage fluctuations is proposed. Conventional relays may mal-operate during under voltage instability condition. The developed algorithm is based on dynamic adjustment of zone 3 setting of distance relays to avoid mal-operation. The proposed algorithm overcomes the pitfall in conventional relays by dynamically changing zone 3 reach setting of the distance relay. The paper describes the new algorithm and presents results obtained from studies on the IEEE 9 bus test system","PeriodicalId":346890,"journal":{"name":"2011 IEEE International Conference on System Engineering and Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on System Engineering and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSENGT.2011.5993442","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A new algorithm for adaptive setting of Zone 3 of distance relays during severe voltage fluctuations is proposed. Conventional relays may mal-operate during under voltage instability condition. The developed algorithm is based on dynamic adjustment of zone 3 setting of distance relays to avoid mal-operation. The proposed algorithm overcomes the pitfall in conventional relays by dynamically changing zone 3 reach setting of the distance relay. The paper describes the new algorithm and presents results obtained from studies on the IEEE 9 bus test system
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