Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics

D. Felici, S. Bonacini, M. Ottavi
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引用次数: 2

Abstract

The availability of low-power, radiation-resistant components has an enormous importance in the development of the electronic systems for modern detectors in a High Energy Physics (HEP) experiment. This paper describes the characterization in terms of radiation effects of two serializer blocks within a high speed transmitter, prior developed with the objective of achieving a power consumption of less than 30 mW at the operating speed of 4.8 Gbit/sec. Within the first serializer, called “simple TMR”, a traditional solution, based on the hardware redundancy, has been implemented. In the second case a new architecture, less power consuming, called “code protected”, has been proposed. The tests previously performed shown an average consumption of ~30 mW and ~19 mW, respectively, for a bit rate of 4.8 Gbit/sec but do not fully clarify if the blocks are suitable for working under extremely high radiation levels. Hence, a deep radiation hardness investigation has been performed and presented here to confirm the availability of these blocks in a HEP electronic system. SEU sensitivities are measured and bit error rates better than 2 E-15 are obtained, confirming that the “code protected” solution assures reliable communications in HEP experiments environment with a smaller power consumption. These blocks have also been designed and tested to cope with a total ionizing dose of 100 Mrad over 10 years of operation.
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HEP实验电子学低功率辐射硬芦苇-所罗门码保护的65纳米串行化器的特性
在高能物理(HEP)实验中,低功率、抗辐射元件的可用性对现代探测器电子系统的发展具有极其重要的意义。本文描述了高速发射机内两个串行块的辐射效应特性,该发射机先前开发的目标是在4.8 Gbit/sec的运行速度下实现低于30 mW的功耗。在第一个序列化器(称为“简单TMR”)中,已经实现了基于硬件冗余的传统解决方案。在第二种情况下,提出了一种新的架构,称为“代码保护”,功耗更低。先前进行的测试显示,在比特率为4.8 Gbit/sec的情况下,平均功耗分别为~30 mW和~19 mW,但没有完全阐明这些模块是否适合在极高的辐射水平下工作。因此,进行了深入的辐射硬度调查,并在此提出,以确认这些块在HEP电子系统中的可用性。测量了SEU的灵敏度,获得了优于2 E-15的误码率,证实了“码保护”解决方案在HEP实验环境下以更小的功耗保证了可靠的通信。经过设计和测试,这些区块在10年的运行中可以承受100毫当量的总电离剂量。
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