{"title":"Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics","authors":"D. Felici, S. Bonacini, M. Ottavi","doi":"10.1109/DFT.2015.7315160","DOIUrl":null,"url":null,"abstract":"The availability of low-power, radiation-resistant components has an enormous importance in the development of the electronic systems for modern detectors in a High Energy Physics (HEP) experiment. This paper describes the characterization in terms of radiation effects of two serializer blocks within a high speed transmitter, prior developed with the objective of achieving a power consumption of less than 30 mW at the operating speed of 4.8 Gbit/sec. Within the first serializer, called “simple TMR”, a traditional solution, based on the hardware redundancy, has been implemented. In the second case a new architecture, less power consuming, called “code protected”, has been proposed. The tests previously performed shown an average consumption of ~30 mW and ~19 mW, respectively, for a bit rate of 4.8 Gbit/sec but do not fully clarify if the blocks are suitable for working under extremely high radiation levels. Hence, a deep radiation hardness investigation has been performed and presented here to confirm the availability of these blocks in a HEP electronic system. SEU sensitivities are measured and bit error rates better than 2 E-15 are obtained, confirming that the “code protected” solution assures reliable communications in HEP experiments environment with a smaller power consumption. These blocks have also been designed and tested to cope with a total ionizing dose of 100 Mrad over 10 years of operation.","PeriodicalId":383972,"journal":{"name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2015.7315160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The availability of low-power, radiation-resistant components has an enormous importance in the development of the electronic systems for modern detectors in a High Energy Physics (HEP) experiment. This paper describes the characterization in terms of radiation effects of two serializer blocks within a high speed transmitter, prior developed with the objective of achieving a power consumption of less than 30 mW at the operating speed of 4.8 Gbit/sec. Within the first serializer, called “simple TMR”, a traditional solution, based on the hardware redundancy, has been implemented. In the second case a new architecture, less power consuming, called “code protected”, has been proposed. The tests previously performed shown an average consumption of ~30 mW and ~19 mW, respectively, for a bit rate of 4.8 Gbit/sec but do not fully clarify if the blocks are suitable for working under extremely high radiation levels. Hence, a deep radiation hardness investigation has been performed and presented here to confirm the availability of these blocks in a HEP electronic system. SEU sensitivities are measured and bit error rates better than 2 E-15 are obtained, confirming that the “code protected” solution assures reliable communications in HEP experiments environment with a smaller power consumption. These blocks have also been designed and tested to cope with a total ionizing dose of 100 Mrad over 10 years of operation.