Measurement of real channel parameters of FPGA based OFDM system

Abstract

Development of wireless technologies has enhanced the need for high data rate support from physical layer. The design of the LTE physical layer (PHY) is heavily influenced by the requirements for high peak transmission rate, spectral efficiency, and multiple channel bandwidths. The Orthogonal Frequency Division Multiplexing (OFDM) is based on using multiple narrow band sub-carriers spread over a wide channel bandwidth. The sub-carriers are mutually orthogonal in the frequency domain which mitigates inter symbol interference (ISI). For real channel communication the channel is prone to shadowing, path loss and fading. So for efficient communication the various channel condition should be analyzed. The main aim of the paper is to develop a FPGA based hardware test-bed to create an OFDM communication environment and measure relevant parameters in real channel condition. This system includes the application of FPGA based high speed data transceiver circuits and high speed communication protocol and efficient and effective signal processing and conditioning.