Yang Wu, Wenwu Wang, Y. Ye, Yinglei Ren, M. Leddige, X. Ye
{"title":"Analysis of Noise Coupling from Switching Voltage Regulator and Power Distribution Network to Differential Stripline Traces","authors":"Yang Wu, Wenwu Wang, Y. Ye, Yinglei Ren, M. Leddige, X. Ye","doi":"10.1109/EMCSI39492.2022.9889513","DOIUrl":null,"url":null,"abstract":"Differential stripline traces often need to be routed close to switching voltage regulators and their power delivery network for today's high-density designs. To study the risk of the noise coupling, this paper offers a comprehensive discussion on noise coupling mechanisms. It classifies noise sources, analyzes coupling mechanisms of each source and states possible impacts. The coupling mechanisms are explained and verified by simulation data, measurement results and a new proposed fitting model.","PeriodicalId":250856,"journal":{"name":"2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCSI39492.2022.9889513","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Differential stripline traces often need to be routed close to switching voltage regulators and their power delivery network for today's high-density designs. To study the risk of the noise coupling, this paper offers a comprehensive discussion on noise coupling mechanisms. It classifies noise sources, analyzes coupling mechanisms of each source and states possible impacts. The coupling mechanisms are explained and verified by simulation data, measurement results and a new proposed fitting model.
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