Surface damage evolution of KDP crystals induced by conical cracks under irradiation of nanosecond laser

Laser Damage Pub Date : 2021-10-12 DOI:10.1117/12.2618820
Wenyu Ding, Mingjun Chen, Jian Cheng, Hao Yang, Linjie Zhao, Qi Liu, Zhichao Liu
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Abstract

The potassium dihydrogen phosphate (KDP) crystals suffer from nanosecond pulse laser irradiation and are susceptible to damage during the operation of ICF system. In particular, the microcracks on the surface of KDP crystals caused by the single-point diamond fly-cutting (SPDF) process are more likely to cause serious damage under the subsequent laser irradiation. However, the mechanism of laser damage is still unclear. A model that can well represents the laser damage response is very important to reveal the mechanism of laser-induced damage. In this work, the electromagnetic field, stress field and temperature field are coupled, the mechanical characteristics of KDP material are considered, and the reasonable strength equation is applied to model the laser damage response of KDP crystal. Then, the conical crack is taken as an example to explore the laser damage response process of KDP crystal caused by surface defects under laser irradiation. It is found that the surface conical cracks have a great influence on the response process and the morphological characteristics of the laser damage. The existence of surface conical crack defects would lead to the extension of the longitudinal cracks beneath the damage crater, which has great disadvantages for the repairing of the laser damage sites. This work is of great guidance for avoiding the defects-induced damage and improving the service life of the crystal applied in ICF systems.
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纳秒激光辐照下KDP晶体锥形裂纹表面损伤演化
磷酸二氢钾(KDP)晶体受到纳秒脉冲激光的照射,在ICF系统运行过程中容易受到损伤。特别是单点金刚石飞切(SPDF)工艺在KDP晶体表面产生的微裂纹,在后续激光照射下更容易造成严重的损伤。然而,激光损伤的机理尚不清楚。一个能很好地表征激光损伤响应的模型对于揭示激光损伤机理是非常重要的。本文将电磁场、应力场和温度场耦合在一起,考虑KDP材料的力学特性,采用合理的强度方程对KDP晶体的激光损伤响应进行建模。然后,以锥形裂纹为例,探讨了激光照射下表面缺陷引起的KDP晶体激光损伤响应过程。研究发现,表面的锥形裂纹对激光损伤的响应过程和形貌特征有很大的影响。表面锥形裂纹缺陷的存在会导致损伤坑下纵向裂纹的扩展,这对激光损伤部位的修复有很大的不利影响。本文的工作对避免晶体缺陷损伤,提高晶体在ICF系统中的使用寿命具有重要的指导意义。
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