{"title":"Damage thresholds and morphology of the front- and back-irradiated SiO2 thin films containing gold nanoparticles as artificial absorbing defects","authors":"S. Papernov, A. Schmid, J. Oliver, A. Rigatti","doi":"10.1117/12.752616","DOIUrl":null,"url":null,"abstract":"Previous ultraviolet-pulsed, laser-damage studies using model thin films with gold nanoparticles as artificial absorbing defects revealed damage morphology in a form of submicrometer-scaled craters. It was also demonstrated that for defects smaller than 20 nm, crater formation is preceded by plasma-ball formation around absorbing defects. In this work an attempt is made to verify symmetry of the plasma ball by conducting film irradiation from the side of the air/film or substrate/film interfaces. In each case, crater-formation thresholds are derived and crater morphology is analyzed by means of atomic force microscopy.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"6720 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Laser Damage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.752616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Previous ultraviolet-pulsed, laser-damage studies using model thin films with gold nanoparticles as artificial absorbing defects revealed damage morphology in a form of submicrometer-scaled craters. It was also demonstrated that for defects smaller than 20 nm, crater formation is preceded by plasma-ball formation around absorbing defects. In this work an attempt is made to verify symmetry of the plasma ball by conducting film irradiation from the side of the air/film or substrate/film interfaces. In each case, crater-formation thresholds are derived and crater morphology is analyzed by means of atomic force microscopy.
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