{"title":"Reliability by design a tool to reduce time-to-market","authors":"S. W. Foo, W. Lien, M. Xie, E. V. Geest","doi":"10.1109/IEMC.1995.524588","DOIUrl":null,"url":null,"abstract":"Reliability of products plays a crucial role in retaining brand loyalty. The conventional approach to reliability analysis resorts to testing the prototype and entails long development time. This is undesirable for electronic products which have very short life cycle. Reliability by design using the stressor-susceptibility interaction model provides a way to address this dilemma. Management no longer have to forgo reliability analysis in the race to shorten time-to-market.","PeriodicalId":231067,"journal":{"name":"Proceedings for Operating Research and the Management Sciences","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings for Operating Research and the Management Sciences","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMC.1995.524588","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Reliability of products plays a crucial role in retaining brand loyalty. The conventional approach to reliability analysis resorts to testing the prototype and entails long development time. This is undesirable for electronic products which have very short life cycle. Reliability by design using the stressor-susceptibility interaction model provides a way to address this dilemma. Management no longer have to forgo reliability analysis in the race to shorten time-to-market.
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