Experimental Study of Neodymium (Nd3+) Doped Mn-Ni based Spinel Ferrite (Mn0.5Ni0.5NdxFe2-xO4) Nanoparticle using Sol-Gel Method

Z. A. Gilani, M. Tariq, H. U. H. K. Khan Asghar, N. Khan
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引用次数: 2

Abstract

Neodymium (Nd3+) doped Mn-Ni based spinel ferrite with composition of Mn0.5Ni0.5NdxFe2-XO4 (x= 0.00, 0.5, 0.10, 0.15 and 0.20), the nanoparticle was essentially formulated by sol-gel self-ignition method. The impact of Nd3+ doping on structural and electrical properties has been extensively studied. XRD verified the FCC spinel arrangement of the synthesized samples. The Debye Scherer formula is used to determine the crystalline size, which was observed in the nano scale ranging between 6 and 10 nm. XRD was used to validate the composition, crystalline size and determining different structural parameters of sample. It is noted that the lattice parameter changes when the Nd3+ doping concentration was enhanced because smaller radius of Fe3+ ions is replaced by large ionic radius of Nd ions. When Nd concentration raises X-Ray density and dislocation density also rises. FTIR verify the compositions of spinel phase and also examine the absorption bands. There were two major frequency bands one was high frequency band ?1 with range of about 500cm-1. Second was low frequency band ?2 with range of about almost 400cm-1. Dielectric performed in the frequency range of 1 MHz to 3 GHz. It was used to determine the effect of Nd3+ doping on various parameters. Dielectric investigations showed decline in dielectric constant. Impedance analysis revealed reducing values with frequency, due to the increase in material conductivity. Real and imaginary modulus study showed the influence of grain boundaries at low frequencies. These properties played significant role in high frequency applications and semiconductor devices.
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溶胶-凝胶法制备掺钕(Nd3+) Mn-Ni基尖晶石铁氧体(Mn0.5Ni0.5NdxFe2-xO4)纳米颗粒的实验研究
纳米粒子的组成为Mn0.5Ni0.5NdxFe2-XO4 (x= 0.00, 0.5, 0.10, 0.15和0.20),主要采用溶胶-凝胶自燃法制备。Nd3+掺杂对结构和电性能的影响已被广泛研究。XRD验证了合成样品的FCC尖晶石排列。Debye Scherer公式用于确定晶体尺寸,在6到10纳米之间的纳米尺度上观察到。采用XRD对样品的组成、晶粒尺寸进行了验证,并确定了样品的不同结构参数。当Nd3+掺杂浓度增加时,晶格参数发生变化,因为较小的Fe3+离子半径被较大的Nd离子半径所取代。当Nd浓度升高时,x射线密度和位错密度也随之升高。FTIR验证了尖晶石相的组成,并检测了其吸收带。有两个主要频段,一个是高频段1,范围约为500cm-1。其次是低频段2,距离约为400cm-1。介电介质在1mhz至3ghz的频率范围内工作。用它来测定Nd3+掺杂对各参数的影响。介电常数研究表明介电常数下降。阻抗分析显示,由于材料电导率的增加,阻抗值随频率的增加而减小。实模量和虚模量研究表明了低频时晶界的影响。这些特性在高频应用和半导体器件中发挥了重要作用。
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