DAC-based 6.4GSPS High Speed and Dual Channel Signal Generation for AXIe Instrument

Abstract

As the application of automatic test systems become more and more extensive, the requirements of test functions for complex tested equipment on the spot are getting higher and higher. It is difficult for ordinary buses to meet the needs of automatic test systems. Advanced bus technology is urgently needed in new types of testing tasks and speed. A new bus standard in automatic testing system has been developed: The Advanced TCA Extensions for Instrumentation and Test (AXIe) bus standard, which is established on the Advanced TCA (ATCA) standard. Both the PCI Express (PCIe) interface and the LAN interface can be supported for data transmission, which makes LXI or PXI testing systems can be compatible with the AXIe system. Based on the background, this thesis studies the AXIe standard bus of testing architecture and instrument module, and establishes a dual-channel high-speed signal generation module that carried on an AXIe instrument module structure.