De-embedding method to accurately measure high-frequency impedance of an O-shape spring contact

Qiaolei Huang, Jing Li, Joe Zhou, Wilson Wu, Y. Qi, J. Fan
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引用次数: 17

Abstract

In this paper, a de-embedding method is proposed to measure the impedance of an innovative O-shape spring contact, for frequency up to 30 GHz. To allow the de-embedding method to be applied in practical situations, both conductor loss and the discontinuity associated with the junction are taken into account. Results obtained from the de-embedding method are validated using full wave simulation. In the simulation model, the O-shape spring contact is cut into two pieces based on the current flow paths, providing a straightforward way to understand why a resonance exists in the impedance profile of the connector. Lastly, the advantages and drawbacks of this method are discussed.
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用去嵌入法精确测量o型弹簧触点高频阻抗
本文提出了一种去嵌入方法,用于测量频率高达30 GHz的新型o形弹簧触点的阻抗。为了使去埋方法应用于实际情况,同时考虑了导体损耗和与结有关的不连续。用全波模拟验证了去嵌入方法的结果。在仿真模型中,o型弹簧触点根据电流流动路径被切成两部分,提供了一种直接的方法来理解为什么在连接器的阻抗剖面中存在共振。最后,对该方法的优缺点进行了讨论。
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