{"title":"A Cost-Effective Production DC/RF On-Wafer GaAs FET Measurement System","authors":"Eric S. Copeland, Matthew M. Borg, K. Kerwin","doi":"10.1109/ARFTG.1989.323964","DOIUrl":null,"url":null,"abstract":"This paper describes a cost-effective DC and microwave test system for production screening of discrete and process-monitor GaAs FETs. Topics covered include system hardware, test software and data storage, DC error-correction, RF GaAs FET modeling, RF probe card technology, error-correction for common-mode inductance, and on-wafer calibration.","PeriodicalId":153615,"journal":{"name":"34th ARFTG Conference Digest","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"34th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323964","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper describes a cost-effective DC and microwave test system for production screening of discrete and process-monitor GaAs FETs. Topics covered include system hardware, test software and data storage, DC error-correction, RF GaAs FET modeling, RF probe card technology, error-correction for common-mode inductance, and on-wafer calibration.
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