Super - TSD, A Generalization of the TSD Network Analyzer Calibration Procedure, Covering n - Port Measurements with Leakage

Abstract

The basic philosophy of the THROUGH-SHORT-DELAY calibration procedure for two-port Automated Network Analyzers, has been extended to n-port S-parameter measurements, while also accounting for the possible signal leakage between all port pairs. The system errors are represented by a 2n-port virtual error network, having n ports connected to the device under test (DUT) and n ports connected to an ideal, error-free multiport network analyzer. The (2n)/sup 2/ T-parameters of the error network are explicitly expressed, in blocks of n/sup 2/ at a time, as matricial functions of the 3n/sup 2/ measured S-parameters of three n-port standards, sequentially replacing the DUT during system calibration. Also the possibility has been proved of correcting the errors arising from repeatable port-impedance value-changes, as those found in switching test sets. This capability has been introduced and tested also in the classical two-port TSD algorithm, by means of minor modification and subsequent post-processing .