Improved Compact Model for High Speed SiGe HBT Breakdown

H. Xu, E. Kasper
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Abstract

High speed SiGe-HBTs provide only a small VCE voltage variation between the saturation region (low VCE) and the breakdown at also rather low values. For high speed circuits it is unavailable to drive the SiGe HBT near the breakdown limits. In compact models used for circuit design the breakdown is described by the week avalanche approximation which is unsufficient for modern HBTs with short collector regions. We propose a more refined approximation which is based on the deed space concept for electrons to be accelerated up to the impact ionization energy. The model is implemented in the VBIC compact model.
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高速SiGe HBT击穿的改进紧凑模型
高速SiGe-HBTs在饱和区(低VCE)和击穿之间仅提供很小的VCE电压变化,也相当低。对于高速电路,在击穿极限附近驱动SiGe HBT是不可用的。在用于电路设计的紧凑模型中,击穿由周雪崩近似描述,这对于具有短集电极区域的现代hbt是不够的。我们提出了一个更精细的近似,这是基于契据空间的概念,电子被加速到冲击电离能。该模型在VBIC紧凑型模型中实现。
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