{"title":"Effect of Aluminium Concentration on Physical Properties of ZnO Films Synthesized by Spray Pyrolysis Method","authors":"S. Boulmelh, Lynda Saci","doi":"10.1109/ICAEE47123.2019.9014606","DOIUrl":null,"url":null,"abstract":"The present work study, the effect of aluminum concentration (0%, 1%, 3%, 5%, 7.5% and 10%) on some physical properties of zinc oxide (ZnO) films. All ZnO doped Al (ZnO: Al) thin films were deposited on optical glass substrates at 350°C by spray pyrolysis method. Polycrystalline films with a hexagonal würtzite phase present a strong (002) preferred orientation parallel to the c-axis. This direction that gradually disappear with increasing aluminum concentration (>7.5%). The grain size obtained values was satisfactory for 1%, 3% and 5% Al-concentrations. In addition, the highest transmittance (95%) was detected at 5% and 7.5% Al concentration. The best obtained value of the Eg is 3.44 eV for an aluminum concentration of 7.5%. Finally, all results confirm that the film deposited with 7.5% Al concentration is the better suited as a window layer in solar cells application.","PeriodicalId":197612,"journal":{"name":"2019 International Conference on Advanced Electrical Engineering (ICAEE)","volume":"151 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Advanced Electrical Engineering (ICAEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICAEE47123.2019.9014606","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The present work study, the effect of aluminum concentration (0%, 1%, 3%, 5%, 7.5% and 10%) on some physical properties of zinc oxide (ZnO) films. All ZnO doped Al (ZnO: Al) thin films were deposited on optical glass substrates at 350°C by spray pyrolysis method. Polycrystalline films with a hexagonal würtzite phase present a strong (002) preferred orientation parallel to the c-axis. This direction that gradually disappear with increasing aluminum concentration (>7.5%). The grain size obtained values was satisfactory for 1%, 3% and 5% Al-concentrations. In addition, the highest transmittance (95%) was detected at 5% and 7.5% Al concentration. The best obtained value of the Eg is 3.44 eV for an aluminum concentration of 7.5%. Finally, all results confirm that the film deposited with 7.5% Al concentration is the better suited as a window layer in solar cells application.