H. Gong, C. Gressus, K. H. Oh, X. Ding, C. Ong, B. Tan
{"title":"The investigation of charging on /spl alpha/-quartz facets by a SEM technique","authors":"H. Gong, C. Gressus, K. H. Oh, X. Ding, C. Ong, B. Tan","doi":"10.1109/CEIDP.1993.378975","DOIUrl":null,"url":null,"abstract":"Electrons trapped on different cuts of /spl alpha/-quartz are determined. From an SEM (scanning electron microscope) mirror image for the charge potential. Different charging abilities for the various cuts are observed; charging ability decreases with increase of cutting angle. This phenomenon is related to polarization energy, defect density, and stresses.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1993.378975","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Electrons trapped on different cuts of /spl alpha/-quartz are determined. From an SEM (scanning electron microscope) mirror image for the charge potential. Different charging abilities for the various cuts are observed; charging ability decreases with increase of cutting angle. This phenomenon is related to polarization energy, defect density, and stresses.<>
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