Using IEEE standard 1057 for testing analog-to-digital converters

Abstract

We have used IEEE Trial Use Standard 1057 since 1989 for testing and evaluating analog-to-digital converters for use in high energy physics experiments. This standard primarily covers waveform digitizers, such as digital oscilloscopes, but much of it is applicable to testing ADCs. Using DC levels and sine, triangle, and specialized waveforms, we measure parameters such as integral and differential nonlinearity, number of effective bits, word error rate, short term settling time, and overvoltage recovery. We summarize the tests performed and describe our experience in using the standard.