L. Carro, É. Cota, M. Lubaszewski, Y. Bertrand, F. Azaïs, M. Renovell
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引用次数: 10
Abstract
This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results.
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