On the design of different concurrent EDC schemes for S-Box and GF(p)

J. Mathew, H. Rahaman, A. Jabir, S. Mohanty, D. Pradhan
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引用次数: 15

Abstract

Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and reliable implementation of cryptographic algorithms in hardware must be able to detect or correct such malicious attacks. Error detection/correction (EDC), through fault tolerance, could be an effective way to mitigate such fault attacks in cryptographic hardware. To this end, we analyze the area, delay, and power overhead for designing the S-Box, which is one of the main complex blocks in the Advanced Encryption Standard (AES), with error detection and correction capability. We use multiple Parity Predictions (PPs), based on various error correcting codes, to detect and correct errors. Various coding techniques are presented, which include simple parity prediction, split parity codes, Hamming, Hsiao, and LDPC codes. The S-Box, GF(p), and PP circuits are synthesized from the specifications, while the decoding and correction circuits are combined to form the complete designs. The analysis shows a comparison of the different approaches characterized by their error detection capability.
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S-Box和GF不同并发EDC方案的设计(p)
最近的研究表明,攻击者可以通过引入内部故障从加密硬件(例如秘密密钥)中检索机密信息。在硬件中安全可靠地实现加密算法必须能够检测或纠正此类恶意攻击。通过容错,错误检测/纠正(EDC)可能是减轻加密硬件中此类错误攻击的有效方法。S-Box是高级加密标准(Advanced Encryption Standard, AES)中主要的复杂块之一,具有错误检测和纠错功能,本文分析了S-Box设计的面积、延迟和功耗。我们使用基于各种纠错码的多个奇偶性预测(PPs)来检测和纠正错误。介绍了各种编码技术,包括简单奇偶预测、分割奇偶码、Hamming码、Hsiao码和LDPC码。根据规格合成S-Box、GF(p)、PP电路,结合译码和纠错电路构成完整的设计。分析比较了不同方法的错误检测能力。
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