{"title":"Reliability evaluation of Gilbert cell mixer based on a hot-carrier stressed device degradation model","authors":"Wei-Cheng Lin, Long-Jei Du, Y. King","doi":"10.1109/RFIC.2004.1320630","DOIUrl":null,"url":null,"abstract":"A comprehensive device degradation model is built for circuit-level reliability evaluation. A sub-circuit model, describing the device degradation under hot-carrier stress is proposed. Combining with the original model, predicting device characteristic changes under FN stressing in our previous work, a complete device degradation model is presented with fairly good agreement with both DC and AC characteristics. In addition, the reliability of a mixed-mode Gilbert cell mixer is investigated and analyzed.","PeriodicalId":140604,"journal":{"name":"2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2004.1320630","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A comprehensive device degradation model is built for circuit-level reliability evaluation. A sub-circuit model, describing the device degradation under hot-carrier stress is proposed. Combining with the original model, predicting device characteristic changes under FN stressing in our previous work, a complete device degradation model is presented with fairly good agreement with both DC and AC characteristics. In addition, the reliability of a mixed-mode Gilbert cell mixer is investigated and analyzed.
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