Minimal Cut Sets and Path Sets in Binary Decision Diagrams and logical differential calculus

M. Kvassay, J. Kostolny
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引用次数: 5

Abstract

Reliability is an important characteristic of many systems. One of the important steps of reliability analysis is the representation and mathematical description of the analyzed system. Binary Decision Diagrams (BDDs) are very convenient for representation of large systems, because they can be processed on computers efficiently. The application of this technique in reliability analysis requires the development of new methods that can be applied on this structure (representation). Some of the most popular tools of reliability engineering are methods based on Minimal Cut Sets (MCSs) or Minimal Path Sets (MPSs). However, these methods are based on the assumption that MCSs (MPSs) are known a priori. Therefore, the development of methods for definition of MCSs (MPSs) based on a BDD is actual problem in reliability analysis. In this paper, we investigate the relation between BDDs and MCSs (MPSs) and proposed a new algorithm that can be used to detect all MCSs (MPSs) in a BDD. Our approach is based on the use of logical differential calculus, especially one of its parts that is known as a direct partial logic derivative.
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二元决策图和逻辑微分中的最小割集和路径集
可靠性是许多系统的一个重要特性。可靠性分析的重要步骤之一是对被分析系统进行表示和数学描述。二进制决策图(bdd)对于大型系统的表示非常方便,因为它们可以在计算机上有效地处理。该技术在可靠性分析中的应用要求开发可应用于该结构(表示)的新方法。可靠性工程中一些最流行的工具是基于最小割集(mcs)或最小路径集(mps)的方法。然而,这些方法都是基于MCSs (mps)是已知先验的假设。因此,开发基于BDD的MCSs (mps)定义方法是可靠性分析中的实际问题。本文研究了BDD和MPSs之间的关系,提出了一种新的算法,可以用来检测BDD中所有的MCSs (MPSs)。我们的方法是基于逻辑微分学的使用,特别是它的一个部分,被称为直接部分逻辑导数。
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