{"title":"Black-box modelling of conducted electromagnetic emissions by adjustable complexity support vector regression machines","authors":"V. Ceperic, G. Gielen, A. Barić","doi":"10.1109/APEMC.2012.6238017","DOIUrl":null,"url":null,"abstract":"A black-box method for modelling of conducted electromagnetic emissions (EME) at an integrated circuit (IC) power supply pin and ground level by adjustable complexity support vector regression machines (ACSVR) is presented. The ACSVR provides a basis for representing the nonlinear dynamic conducted EME. The ACSVR enables accurate modelling of conducted EME according to the IEC 61967-4 1Ω method and allows the adjustment of accuracy versus model simulation speed. As a test case, the EME model of conducted emissions of a 242-transistor voltage reference with offset compensation is presented. The resulting models (implemented in Verilog A) are accurate and fast to execute.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2012.6238017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A black-box method for modelling of conducted electromagnetic emissions (EME) at an integrated circuit (IC) power supply pin and ground level by adjustable complexity support vector regression machines (ACSVR) is presented. The ACSVR provides a basis for representing the nonlinear dynamic conducted EME. The ACSVR enables accurate modelling of conducted EME according to the IEC 61967-4 1Ω method and allows the adjustment of accuracy versus model simulation speed. As a test case, the EME model of conducted emissions of a 242-transistor voltage reference with offset compensation is presented. The resulting models (implemented in Verilog A) are accurate and fast to execute.
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